The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2023

Filed:

May. 26, 2020
Applicant:

Hanwha Aerospace Co., Ltd., Changwon-si, KR;

Inventors:

Jin Sung Park, Changwon-si, KR;

Jin Ho Jang, Changwon-si, KR;

Assignee:

Versarien PLC, Gloucestershire, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 31/00 (2006.01); C23C 16/26 (2006.01); G01N 33/38 (2006.01);
U.S. Cl.
CPC ...
G01N 31/005 (2013.01); C23C 16/26 (2013.01); G01N 33/38 (2013.01);
Abstract

Provided is a method of inspecting a growth quality of a graphene layer of a graphene-grown copper foil obtained by growing the graphene layer on a copper foil layer by chemical vapor deposition (CVD), the method including reacting oxygen or water molecules with the copper foil layer via a defect portion of the graphene layer, partitioning an entire region of the graphene-grown copper foil into partial regions, sequentially obtaining images of the partial regions, detecting, with respect to each of the images of the partial regions, an oxidized region where the copper foil layer is oxidized, and setting the oxidized region as a graphene defect region, and obtaining a ratio of an area of the graphene defect region to an entire area of each of the images of the partial regions.


Find Patent Forward Citations

Park, Jin. (2023). Method and system for inspecting growth quality of graphene (U.S. Patent No. 11714071). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11714071

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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