The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2023

Filed:

Aug. 16, 2021
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;

Inventors:

Cheng-Bo Shu, Tainan, TW;

Chung-Jen Huang, Tainan, TW;

Yun-Chi Wu, Tainan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/28 (2006.01); H10B 41/49 (2023.01); H01L 29/06 (2006.01); H01L 29/423 (2006.01); H01L 21/8249 (2006.01); H01L 21/02 (2006.01); H01L 29/78 (2006.01); H01L 27/06 (2006.01); H01L 21/8234 (2006.01); H01L 29/788 (2006.01); H01L 29/08 (2006.01); H01L 29/66 (2006.01); H10B 20/20 (2023.01); H10B 41/30 (2023.01); H10B 41/35 (2023.01); H10B 43/30 (2023.01); H10B 43/40 (2023.01); H01L 21/762 (2006.01); H01L 21/3213 (2006.01); H01L 21/027 (2006.01); H01L 29/10 (2006.01); H01L 29/51 (2006.01); H01L 21/8238 (2006.01);
U.S. Cl.
CPC ...
H10B 41/49 (2023.02); H01L 21/02236 (2013.01); H01L 21/28211 (2013.01); H01L 21/8249 (2013.01); H01L 21/823462 (2013.01); H01L 27/0623 (2013.01); H01L 29/0649 (2013.01); H01L 29/0653 (2013.01); H01L 29/0878 (2013.01); H01L 29/40114 (2019.08); H01L 29/40117 (2019.08); H01L 29/42328 (2013.01); H01L 29/42364 (2013.01); H01L 29/66689 (2013.01); H01L 29/66825 (2013.01); H01L 29/7816 (2013.01); H01L 29/7881 (2013.01); H10B 20/20 (2023.02); H10B 41/30 (2023.02); H10B 41/35 (2023.02); H10B 43/30 (2023.02); H10B 43/40 (2023.02); H01L 21/0274 (2013.01); H01L 21/02255 (2013.01); H01L 21/32133 (2013.01); H01L 21/76224 (2013.01); H01L 21/76229 (2013.01); H01L 21/76232 (2013.01); H01L 21/823481 (2013.01); H01L 21/823878 (2013.01); H01L 29/086 (2013.01); H01L 29/0847 (2013.01); H01L 29/1083 (2013.01); H01L 29/1095 (2013.01); H01L 29/42344 (2013.01); H01L 29/513 (2013.01); H01L 29/6656 (2013.01); H01L 29/66681 (2013.01); H01L 29/7833 (2013.01);
Abstract

Various embodiments of the present application are directed towards a method to integrate NVM devices with a logic or BCD device. In some embodiments, an isolation structure is formed in a semiconductor substrate. The isolation structure demarcates a memory region of the semiconductor substrate, and further demarcates a peripheral region of the semiconductor substrate. The peripheral region may, for example, correspond to BCD device or a logic device. A doped well is formed in the peripheral region. A dielectric seal layer is formed covering the memory and peripheral regions, and further covering the doped well. The dielectric seal layer is removed from the memory region, but not the peripheral region. A memory cell structure is formed on the memory region using a thermal oxidation process. The dielectric seal layer is removed from the peripheral region, and a peripheral device structure including a gate electrode is formed on the peripheral region.


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