The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2023

Filed:

Feb. 01, 2021
Applicants:

Semiconductor Manufacturing International (Shanghai) Corporation, Shanghai, CN;

Semiconductor Manufacturing International (Beijing) Corporation, Beijing, CN;

Inventors:

Haiyang Zhang, Shanghai, CN;

Yan Wang, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 21/3065 (2006.01); H01L 29/06 (2006.01); H01L 29/10 (2006.01); H01L 29/161 (2006.01); H01L 29/20 (2006.01); H01L 27/092 (2006.01); H01L 21/84 (2006.01); H01L 27/12 (2006.01); H01L 21/8234 (2006.01); H01L 29/417 (2006.01); H01L 21/8238 (2006.01); H01L 27/088 (2006.01); H10B 12/00 (2023.01);
U.S. Cl.
CPC ...
H01L 29/6681 (2013.01); H01L 21/3065 (2013.01); H01L 29/0649 (2013.01); H01L 29/1033 (2013.01); H01L 29/161 (2013.01); H01L 29/20 (2013.01); H01L 29/6653 (2013.01); H01L 29/66522 (2013.01); H01L 29/66553 (2013.01); H01L 29/66787 (2013.01); H01L 29/785 (2013.01); H01L 21/823431 (2013.01); H01L 21/823821 (2013.01); H01L 21/845 (2013.01); H01L 27/0886 (2013.01); H01L 27/0924 (2013.01); H01L 27/1211 (2013.01); H01L 29/41791 (2013.01); H01L 29/66795 (2013.01); H01L 29/7831 (2013.01); H01L 29/7856 (2013.01); H10B 12/056 (2023.02); H10B 12/36 (2023.02);
Abstract

Semiconductor device fabrication method is provided. The method includes providing a substrate; forming a first semiconductor layer on the substrate; forming a stack of semiconductor layer structures on the first semiconductor layer, each of the semiconductor layer structures comprising a second semiconductor layer and a third semiconductor layer on the second semiconductor layer, the second and third semiconductor layers having at least a common compound element, and the third semiconductor layer and the first semiconductor layer having a same semiconductor compound; performing an etching process to form a fin structure; performing a selective etching process on the second semiconductor layer to form a first air gap between the first semiconductor layer and the third semiconductor layer and a second air gap between each of adjacent third semiconductor layers in the stack of one or more semiconductor layer structures; and filling the first and second air gaps with an insulator layer.


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