The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2023

Filed:

Mar. 09, 2020
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Cheng-Ta Wu, Shueishang Township, TW;

Kuan-Liang Liu, Pingtung, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/762 (2006.01); H01L 27/12 (2006.01); H01L 21/84 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76245 (2013.01); H01L 21/84 (2013.01); H01L 27/1203 (2013.01);
Abstract

The present disclosure, in some embodiments, relates to a method of forming a semiconductor structure. The method includes forming a plurality of bulk micro defects within a handle substrate. Sizes of the plurality of bulk micro defects are increased to form a plurality of bulk macro defects (BMDs) within the handle substrate. Some of the plurality of BMDs are removed from within a first denuded region and a second denuded region arranged along opposing surfaces of the handle substrate. An insulating layer is formed onto the handle substrate. A device layer comprising a semiconductor material is formed onto the insulating layer. The first denuded region and the second denuded region vertically surround a central region of the handle substrate that has a higher concentration of the plurality of BMDs than both the first denuded region and the second denuded region.


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