The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2023
Filed:
Jul. 16, 2021
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Donggyu Minn, Suwon-si, KR;
Daehyun Kang, Suwon-si, KR;
Yonghoon Kim, Suwon-si, KR;
Jihoon Kim, Suwon-si, KR;
Hyundo Ryu, Suwon-si, KR;
Jeeho Park, Suwon-si, KR;
Sunggi Yang, Suwon-si, KR;
Youngchang Yoon, Suwon-si, KR;
Sehyug Jeon, Suwon-si, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/3167 (2006.01); G01R 27/32 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2822 (2013.01); G01R 27/32 (2013.01); G01R 31/3167 (2013.01);
Abstract
The disclosure relates to an RFIC apparatus, and more particularly, to an RFIC circuit having a test circuit, a test apparatus, and a test method thereof. Further, the disclosure relates to a method for estimating or determining a DC gain using a test apparatus and an RF circuit in a DC/AC test stage, and detecting defects of the RF circuit based on the estimated or determined DC gain.