The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2023

Filed:

Sep. 23, 2021
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Niranjan Hasabnis, Fremont, CA (US);

Justin Gottschlich, Santa Clara, CA (US);

Jeremie Dreyfuss, Raanana, IL;

Amitai Armon, Tel-Aviv, IL;

Itamar Ben-Ari, Givat Hashlosha, IL;

Oren David Kimhi, Chandler, AZ (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01); G06F 8/40 (2018.01); G06F 8/73 (2018.01);
U.S. Cl.
CPC ...
G06F 11/3648 (2013.01); G06F 8/40 (2013.01); G06F 8/73 (2013.01);
Abstract

Methods, apparatus, systems, and articles of manufacture are disclosed to detect code defects. An example apparatus includes repository interface circuitry to retrieve code repositories corresponding to a programming language of interest, tree generating circuitry to generate parse trees corresponding to code blocks contained in the code repositories, directed acyclic graph (DAG) circuitry to generate DAGs corresponding to respective ones of the parse trees, the DAGs including control flow information and data flow information, abstraction generating circuitry to abstract the DAGs, invariant identification circuitry to extract invariants from the abstracted DAGs, and DAG comparison circuitry to cluster respective ones of the extracted invariants to identify respective ones of the abstracted DAGs with common invariants.


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