The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2023

Filed:

Dec. 04, 2020
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventor:

Saeed Sharifi Tehrani, San Diego, CA (US);

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G11C 29/10 (2006.01); G06F 3/06 (2006.01); G11C 16/26 (2006.01); G11C 16/34 (2006.01); G06F 11/20 (2006.01); G06F 11/30 (2006.01); G11C 16/04 (2006.01);
U.S. Cl.
CPC ...
G11C 29/10 (2013.01); G06F 3/0619 (2013.01); G06F 3/0659 (2013.01); G06F 3/0679 (2013.01); G06F 11/2094 (2013.01); G06F 11/3037 (2013.01); G11C 16/26 (2013.01); G11C 16/349 (2013.01); G11C 16/0483 (2013.01);
Abstract

Exemplary methods, apparatuses, and systems include receiving read operations. The read operations are divided into a current set of a sequence of read operations and one or more other sets of sequences of read operations. An aggressor read operation is selected from the current set. A position in the sequence of read operations in the current set is determined such that the position that is preceded by at least a minimum number of read operations following a previous data integrity scan in a previous set of read operations. A data integrity scan is performed on a victim of the aggressor read operation at the determined position in the sequence of the current set of read operations.


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