The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2023
Filed:
Jul. 25, 2022
Jmp Statistical Discovery Llc, Cary, NC (US);
Caleb Bridges King, Morrisville, NC (US);
Ryan Adam Lekivetz, Cary, NC (US);
Joseph Albert Morgan, Raleigh, NC (US);
Yeng Saanchi, Raleigh, NC (US);
Bradley Allen Jones, Cary, NC (US);
JMP Statistical Discovery LLC, Cary, NC (US);
Abstract
A computing device obtains settings for a design of an experiment. The settings include a first sample size that indicates an amount of members for a first group observed as part of the experiment, a design quality metric that assesses, based on the first sample size, a quality of the design for the experiment prior to conducting the experiment, and a parameter pertaining to the first group. The computing device also displays first and second graphs of the design quality metric on a graphical user interface. The first graph is displayed as a function of the first sample size and the second graph is displayed as a function of the parameter pertaining to the first group. The computing device also receives a first user indication to change one or more of the settings, and then updates both the first and second graphs to account for the first user indication.