The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2023

Filed:

Aug. 19, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Joseph A. De La Cerda, Boise, ID (US);

Bruce J. Ford, Meridian, ID (US);

Benjamin Rivera, Boise, ID (US);

Nicolas Soberanes, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 12/02 (2006.01); G06N 3/04 (2023.01); G06F 18/214 (2023.01);
U.S. Cl.
CPC ...
G06F 12/0253 (2013.01); G06F 3/0604 (2013.01); G06F 3/0659 (2013.01); G06F 3/0679 (2013.01); G06F 12/0246 (2013.01); G06F 18/214 (2023.01); G06N 3/04 (2013.01);
Abstract

Apparatuses and methods can be related to performing prediction based garbage collection. Performing prediction based garbage collection can include performing a first instance of garbage collection, of the memory device, using a first circuitry of the controller and generating a prediction using a second circuitry of the controller. A confidence interval can also be generated for the prediction using the second circuitry of the controller. Responsive to determining that the confidence interval is greater than a threshold, a second instance of garbage collection, of the memory device, can be triggered using the first circuitry of the controller where the first instance of garbage collection is triggered before the second instance of garbage collection.


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