The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2023

Filed:

Nov. 03, 2021
Applicant:

Synopsys, Inc., Mountain View, CA (US);

Inventors:

Amit Gopal M. Purohit, Bangalore, IN;

Sorin Ioan Popa, Saint Ismier, FR;

Denis Martin, Palo Alto, CA (US);

Paras Chhabra, Bangalore, IN;

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 30/30 (2020.01); G06F 30/333 (2020.01); G01R 31/317 (2006.01); G01R 31/3177 (2006.01); G01R 31/3181 (2006.01); G01R 31/319 (2006.01); G01R 31/3183 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G06F 30/333 (2020.01); G01R 31/3177 (2013.01); G01R 31/31704 (2013.01); G01R 31/31813 (2013.01); G01R 31/31908 (2013.01); G01R 31/318371 (2013.01); G01R 31/318583 (2013.01);
Abstract

A method includes identifying state holding pipeline stages in a pipeline path of a design for test (DFT) of an integrated circuit design, splitting each pattern of a plurality of patterns into a first part and a second part, reformatting the plurality of patterns to generate another plurality of patterns such that the first part and the second part of each pattern of the plurality patterns are included in different patterns of the another plurality of patterns. The length of the first part is a function of a number of the identified pipeline stages.


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