The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2023

Filed:

Feb. 24, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Vamsi Pavan Rayaprolu, San Jose, CA (US);

Kishore Kumar Muchherla, Fremont, CA (US);

Harish R. Singidi, Fremont, CA (US);

Ashutosh Malshe, Fremont, CA (US);

Gianni S. Alsasua, Rancho Cordova, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/406 (2006.01); G11C 11/408 (2006.01); G11C 11/409 (2006.01); G11C 29/44 (2006.01);
U.S. Cl.
CPC ...
G11C 11/40622 (2013.01); G11C 11/409 (2013.01); G11C 11/4085 (2013.01); G11C 29/44 (2013.01);
Abstract

Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations including performing a first data integrity check on memory pages of a first set of wordlines of the memory device; performing a second data integrity check on memory pages of a second set of wordlines comprising a plurality of wordlines from the first set of wordlines; identifying, among the first set of wordlines and the second set of wordlines, a wordline having a first data state metric value obtained from the first data integrity check equal to a second data state metric value obtained from the second data integrity check; and performing a third data integrity check on a third set of wordlines comprising at least one wordline from the first set of wordlines, wherein the third data integrity check excludes the identified wordline.


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