The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2023

Filed:

Mar. 19, 2018
Applicant:

Furukawa Co., Ltd., Tokyo, JP;

Inventors:

Yujiro Ishihara, Tochigi, JP;

Hiroki Goto, Tochigi, JP;

Shoichi Fuda, Tochigi, JP;

Tomohiro Kobayashi, Tochigi, JP;

Hitoshi Sasaki, Tochigi, JP;

Assignee:

FURUKAWA CO., LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 29/40 (2006.01); C23C 16/34 (2006.01); C30B 25/18 (2006.01); H01L 21/02 (2006.01); H01L 21/78 (2006.01); C01B 21/06 (2006.01);
U.S. Cl.
CPC ...
C30B 29/406 (2013.01); C23C 16/34 (2013.01); C30B 25/183 (2013.01); C30B 25/186 (2013.01); H01L 21/0242 (2013.01); H01L 21/0254 (2013.01); H01L 21/0262 (2013.01); H01L 21/02458 (2013.01); H01L 21/02694 (2013.01); H01L 21/7813 (2013.01); C01B 21/06 (2013.01); Y10T 428/219 (2015.01);
Abstract

There is provided a method of manufacturing a group III nitride semiconductor substrate including: a fixing step Sof fixing abase substrate, which includes a group III nitride semiconductor layer having a semipolar plane as a main surface, to a susceptor; a first growth step Sof forming a first growth layer by growing a group III nitride semiconductor over the main surface of the group III nitride semiconductor layer in a state in which the base substrate is fixed to the susceptor using an HVPE method; a cooling step Sof cooling a laminate including the susceptor, the base substrate, and the first growth layer; and a second growth step Sof forming a second growth layer by growing a group III nitride semiconductor over the first growth layer in a state in which the base substrate is fixed to the susceptor using the HVPE method.


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