The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2023

Filed:

Mar. 17, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Hyunui Lee, Kanagawa, JP;

Won Joo Yun, Boise, ID (US);

Baekkyu Choi, San Jose, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01); H04L 25/00 (2006.01); H04L 25/40 (2006.01); H04L 7/02 (2006.01);
U.S. Cl.
CPC ...
H04L 7/02 (2013.01);
Abstract

The present application is directed to signal delay control and related apparatuses, systems, and methods. An apparatus includes delay elements and control circuitry electrically connected to the delay elements. The delay elements are configured to receive skewed data signals and delay codes indicating delay quantities. The delay elements are also configured to provide delayed data signals delayed relative to the skewed data signals by the delay quantities. The control circuitry is configured to provide the delay codes, which are selected to reduce a timing skew of the delayed data signals relative to a timing skew of the skewed data signals. A system includes a first device, a second device including the apparatus, and transmission lines electrically connected between the first device and the second device. A method includes calibrating the delay codes.


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