The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2023

Filed:

Aug. 14, 2019
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

In-kwon Kim, Hwaseong-si, KR;

Seung-ho Park, Suwon-si, KR;

Sang-won Bae, Suwon-si, KR;

Woo-in Lee, Goyang-si, KR;

Hyo-san Lee, Hwaseong-si, KR;

Sun-jae Jang, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/321 (2006.01); B24B 37/04 (2012.01); B24B 57/00 (2006.01); B24B 37/11 (2012.01);
U.S. Cl.
CPC ...
H01L 21/3212 (2013.01); B24B 37/04 (2013.01); B24B 37/11 (2013.01); B24B 57/00 (2013.01);
Abstract

A chemical mechanical polishing (CMP) apparatus includes a polishing pad on a polishing platen, a polishing head on the polishing pad, the polishing head having a membrane to hold a wafer on the polishing pad, and a polishing slurry feeding line to feed a polishing slurry, and a retainer ring around the membrane and in contact with the polishing pad to prevent detachment of the wafer, the retainer ring including a polishing slurry feeding inlet connected to the polishing slurry feeding line to feed the polishing slurry onto the polishing pad.


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