The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2023
Filed:
Dec. 08, 2021
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventor:
Michael Richard Spica, Eagle, ID (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 13/28 (2006.01); G06F 3/06 (2006.01); G06F 13/16 (2006.01); G06F 13/42 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0659 (2013.01); G06F 3/0653 (2013.01); G06F 3/0679 (2013.01); G06F 13/1673 (2013.01); G06F 13/1678 (2013.01); G06F 13/1684 (2013.01); G06F 13/28 (2013.01); G06F 13/42 (2013.01); G06F 13/4282 (2013.01);
Abstract
Command execution data is received. The command execution data comprises a block address corresponding to an functional component, a register identifier corresponding to a design for testability (DFT) register of the functional component, and command data. The command execution data is converted to a serial command. The serial command is committed to the DFT register of the functional component. A response to the serial command is received. The response is generated by the functional component based on the serial command. The response is converted to command response data and is provided to a testing sub-system.