The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2023

Filed:

Oct. 25, 2021
Applicant:

Nanotronics Imaging, Inc., Cuyahoga Falls, OH (US);

Inventors:

Matthew C. Putman, Brooklyn, NY (US);

Vadim Pinskiy, Wayne, NJ (US);

Eun-Sol Kim, Cliffside Park, NJ (US);

Andrew Sundstrom, Brooklyn, NY (US);

Assignee:

Nanotronics Imaging, Inc., Cuyahoga Falls, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/406 (2006.01); G05B 19/19 (2006.01); G06N 20/20 (2019.01);
U.S. Cl.
CPC ...
G05B 19/406 (2013.01); G05B 19/19 (2013.01); G05B 2219/40556 (2013.01); G06N 20/20 (2019.01);
Abstract

Aspects of the disclosed technology provide an Artificial Intelligence Process Control (AIPC) for automatically detecting errors in a manufacturing workflow of an assembly line process, and performing error mitigation through the update of instructions or guidance given to assembly operators at various stations. In some implementations, the disclosed technology utilizes one or more machine-learning models to perform error detection and/or propagate instructions/assembly modifications necessary to rectify detected errors or to improve the product of manufacture.


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