The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2023
Filed:
Dec. 23, 2019
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventors:
Daniel S. Froelich, Portland, OR (US);
Debendra Das Sharma, Saratoga, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G06F 11/22 (2006.01); H04B 3/46 (2015.01); G01R 31/3177 (2006.01); G01R 31/28 (2006.01); G01R 31/327 (2006.01); G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/36 (2006.01); G06F 13/16 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31703 (2013.01); G01R 31/3177 (2013.01); G01R 31/31725 (2013.01); G06F 11/221 (2013.01); H04B 3/46 (2013.01); G01R 31/2851 (2013.01); G01R 31/3275 (2013.01); G06F 11/00 (2013.01); G06F 11/0751 (2013.01); G06F 11/2205 (2013.01); G06F 11/3688 (2013.01); G06F 13/1689 (2013.01); H01L 22/34 (2013.01); H01L 2225/06596 (2013.01);
Abstract
A test mode signal is generated to include a test pattern and an error reporting sequence. The test mode signal is sent on link that includes one or more extension devices and two or more sublinks. The test mode signal is to be sent on a particular one of the sublinks and is to be used by a receiving device to identify errors on the particular sublink. The error reporting sequence is to be encoded with error information to describe error status of sublinks in the plurality of sublinks.