The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2023
Filed:
Apr. 23, 2021
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Hyunui Lee, Tokyo, JP;
Masayoshi Yamazaki, Kanagawa, JP;
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/50 (2006.01); G11C 7/10 (2006.01); H03K 19/00 (2006.01);
U.S. Cl.
CPC ...
G11C 29/50008 (2013.01); G11C 7/109 (2013.01); G11C 7/1057 (2013.01); G11C 7/1063 (2013.01); G11C 7/1069 (2013.01); G11C 7/1084 (2013.01); G11C 7/1096 (2013.01); H03K 19/0005 (2013.01); G11C 2207/2254 (2013.01);
Abstract
A device may include a ZQ calibration circuit. The ZQ calibration circuit may include a first register configured to store a first impedance code generated responsive to a ZQ calibration command. The ZQ calibration circuit may also include a second register configured to store a shift value. Further, the ZQ calibration circuit may include a compute block configured to generate a second impedance code based on the first impedance code and the shift value. Systems and related methods of operation are also described.