The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2023

Filed:

Sep. 11, 2020
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:

Thomas Jarik Huisman, Eindhoven, NL;

Sander Frederik Wuister, Eindhoven, NL;

Hermanus Adrianus Dillen, Maarheeze, NL;

Dorothea Maria Christina Oorschot, Veldhoven, NL;

Assignee:

ASML Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/2251 (2018.01); G06T 7/62 (2017.01); G03F 1/84 (2012.01); G03F 7/20 (2006.01); G06T 7/00 (2017.01); G03F 7/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2251 (2013.01); G03F 1/84 (2013.01); G03F 7/7085 (2013.01); G03F 7/70608 (2013.01); G06T 7/0004 (2013.01); G06T 7/62 (2017.01); G01N 2223/07 (2013.01); G01N 2223/401 (2013.01); G01N 2223/507 (2013.01); G06T 2207/10061 (2013.01); G06T 2207/30148 (2013.01);
Abstract

Apparatuses, systems, and methods for inspecting a semiconductor sample are disclosed. In some embodiments, the sample may comprise a structure having a plurality of openings in a top layer of the structure. In some embodiments, the method may comprise generating an image of the structure using a SEM; inspecting an opening of the plurality of openings by determining a dimension of the opening based on the image and determining an open-state of the opening, based on a contrast of the image; and determining a quality of the opening based on both the determined dimension and the determined open-state of the opening.


Find Patent Forward Citations

Loading…