The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2023

Filed:

Apr. 20, 2021
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Blake Erickson, Gilroy, CA (US);

Keith Berding, Truckee, CA (US);

Michael Kutney, Santa Clara, CA (US);

Zhaozhao Zhu, Milpitas, CA (US);

Tsung Feng Wu, San Jose, CA (US);

Michael D. Willwerth, Campbell, CA (US);

Jeffrey Ludwig, San Jose, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/32 (2006.01); G01J 3/02 (2006.01); G01N 21/25 (2006.01); G01N 21/68 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01J 3/32 (2013.01); G01J 3/0291 (2013.01); G01N 21/255 (2013.01); G01N 21/68 (2013.01); G01N 21/9501 (2013.01);
Abstract

An apparatus includes a base component and collimators housed within the base component. The collimators correspond to collection cylinders for sampling optical emission spectroscopy (OES) signals with respect to locations of a wafer in an etch chamber. The apparatus further includes a guide, operatively coupled to the plurality of collimators, to guide the sampling of the OES signals along paths for sampling the OES signals.


Find Patent Forward Citations

Loading…