The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2023

Filed:

Feb. 20, 2019
Applicant:

Kistler Holding Ag, Winterthur, CH;

Inventors:

Marco Angliker, Zürich, CH;

Viola Ehrensperger, Henggart, CH;

Frederic De Simoni, Aarau, CH;

Michael Lauffer, Bülach, CH;

Assignee:

Kistler Holding AG, Winterthur, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); G01D 7/00 (2006.01); G01D 21/00 (2006.01);
U.S. Cl.
CPC ...
G01D 18/00 (2013.01); G01D 7/00 (2013.01); G01D 21/00 (2013.01);
Abstract

A method of using a measuring system for detecting a measured physical variable pertains to measuring systems that include a plurality of transmission members forming a measuring chain for detecting the measured physical variable and in which transmission members that are immediately successive in the measuring chain are in a cause-and-effect relationship to each other. The method includes the steps of: a) specifying the measured physical variable to be detected; b) using a computer to compile several measuring chains that include transmission members necessary for the detection of the specified measured physical variable; c) determination of performance criteria of the compiled measuring chains; d) using the determined performance criteria to assess each of the compiled measuring chains; and e) identification of a measuring chain that best satisfies one of the performance criteria determined.


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