The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2023
Filed:
Jan. 28, 2020
Toyota Research Institute, Inc., Los Altos, CA (US);
Naveen Kuppuswamy, Arlington, MA (US);
Alejandro M. Castro, Cambridge, MA (US);
Alexander Alspach, Somerville, MA (US);
Toyota Research Institute, Inc., Los Altos, CA (US);
Abstract
Systems and methods for estimating deformation and field of contact forces are described. A method includes generating a reference configuration including reference points in space. The reference configuration corresponds to an initial shape of a membrane prior to contact with the manipuland. The method further includes receiving raw data from a TOF device. The raw data includes points in space measured by the TOF device and indicating deformation of the membrane due to contact with the manipuland. The method further includes determining deformation of the membrane that best approximates a current configuration in a least squares sense while satisfying a discrete physical model enforced as a linear constraint that corresponds to a linearized physical model of the deformation that is discretized with an FEM, linearizing the relationship, and estimating deformation and field of contact forces by solving a least squares formulation with physical constraints cast as a sparse quadratic program.