The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2023

Filed:

Jul. 10, 2020
Applicant:

Taiwan Semiconductor Manufacturing Company Limited, Hsinchu, TW;

Inventors:

Heng-Wei Liao, Taichung, TW;

Kuo-Hua Wang, Hsinchu, TW;

Ming-Tsai Kuan, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B08B 1/00 (2006.01); B08B 7/04 (2006.01); B08B 5/04 (2006.01); H01L 21/67 (2006.01); H01L 21/687 (2006.01);
U.S. Cl.
CPC ...
B08B 7/04 (2013.01); B08B 1/005 (2013.01); B08B 5/04 (2013.01); H01L 21/67103 (2013.01); H01L 21/68707 (2013.01);
Abstract

A wafer handler cleaning tool may include a scraping device positioned near semiconductor equipment (e.g., a cooling plate, a semiconductor processing device, and/or the like) such that the scraping device removes foreign objects, debris, and/or other types of matter from the underside of the wafer handler when the wafer handler loads a wafer into the semiconductor equipment and/or unloads the wafer from the semiconductor equipment. Moreover, the wafer handler cleaning tool may include a negative pressure device to draw the removed foreign objects, debris, and/or other types of matter away from the scraping device and toward a filtration device such that the filtration device captures the removed foreign objects, debris, and/or other types of matter.


Find Patent Forward Citations

Liao, Heng-Wei. (2023). Wafer handler cleaning tool (U.S. Patent No. 11666951). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11666951

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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