The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Jun. 29, 2019
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

John A. Swanson, Forest Grove, OR (US);

Vivek K. Singh, Portland, OR (US);

Kumara Sastry, Hillsboro, OR (US);

Helen F. Parks, Hillsboro, OR (US);

I-Tzu Chen, Portland, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/126 (2023.01); G06N 20/00 (2019.01); G06N 7/01 (2023.01); G06T 5/00 (2006.01); G06F 17/18 (2006.01); G06F 18/24 (2023.01); G06V 10/762 (2022.01); G06V 10/764 (2022.01); G06V 10/40 (2022.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); G06F 17/18 (2013.01); G06F 18/24 (2023.01); G06N 3/126 (2013.01); G06N 7/01 (2023.01); G06N 20/00 (2019.01); G06V 10/40 (2022.01); G06V 10/762 (2022.01); G06V 10/764 (2022.01);
Abstract

A method comprising identifying a set of target features for a plurality of data instances of an input data collection; determining feature values for the set of target features for the plurality of data instances; identifying a plurality of outlier data instances based on the determined feature values; identifying a plurality of noisy data instances from the outlier data instances based on feature values of the plurality of noisy data instances, wherein a noisy data instance is identified based on a determination that noise is present in noisy data instance; and providing an indication of the plurality of noisy data instances.


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