The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2023
Filed:
Aug. 08, 2022
Jmp Statistical Discovery Llc, Cary, NC (US);
Ryan Adam Lekivetz, Cary, NC (US);
Joseph Albert Morgan, Raleigh, NC (US);
Caleb Bridges King, Cary, NC (US);
Bradley Allen Jones, Cary, NC (US);
Mark Wallace Bailey, Haddonfield, NJ (US);
Jacob Davis Rhyne, Dallas, NC (US);
JMP Statistical Discovery LLC, Cary, NC (US);
Abstract
An apparatus includes a processor to: present prompts guiding selection of first subset terms for estimation of variants of an experiment design based on a model thereof, and second subset terms for estimation using Bayesian modification; monitor for selections of term; in response to each change in the first subset terms, determine whether all first subset terms can be estimated based on the model; in response to the first subset including too many terms, present an indication of too many terms being selected for estimation based on the model; in response to the first subset including fewer terms than can be estimated based on the model, present an indication that more terms could be selected for estimation based on the model; and for each variant of the experiment design, estimate each first subset term based on the model, and estimate each second subset term using Bayesian modification.