The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

Oct. 14, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Joshua C. Myers, Austin, TX (US);

Jose A. Hejase, Austin, TX (US);

Junyan Tang, Austin, TX (US);

Pavel Roy Paladhi, Austin, TX (US);

Wiren D. Becker, Hyde Park, NY (US);

Sungjun Chun, Austin, TX (US);

Daniel M. Dreps, Georgetown, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01P 5/02 (2006.01); H01P 3/12 (2006.01); H05K 1/11 (2006.01); H05K 1/02 (2006.01);
U.S. Cl.
CPC ...
H01P 5/024 (2013.01); H01P 3/121 (2013.01); H05K 1/0215 (2013.01); H05K 1/0246 (2013.01); H05K 1/116 (2013.01); H05K 2201/037 (2013.01);
Abstract

Methods and apparatuses for vertically transitioning signals between substrate integrated waveguides within a multilayered printed circuit board (PCB) are disclosed. A first substrate integrated waveguide (SIW) is provided in a first layer of the PCB, the first SIW having a first terminal portion. A second SIW is provided in a second layer of the PCB, the second SIW having a second terminal portion that overlaps with the first terminal portion, wherein a first ground plane separates the first SIW and the second SIW. A vertical transition comprising an aperture in the first ground plane that is disposed in an area defined by the overlap of the first terminal portion and the second terminal portion, such that a signal propagated in the first SIW transitions to the second SIW in a different layer through the aperture.


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