The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

Dec. 02, 2020
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventor:

Ming-Yeh Chuang, McKinney, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/092 (2006.01); H01L 21/762 (2006.01); H01L 21/8234 (2006.01); H01L 29/40 (2006.01); H01L 29/417 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 27/0924 (2013.01); H01L 21/762 (2013.01); H01L 21/823431 (2013.01); H01L 29/402 (2013.01); H01L 29/41791 (2013.01); H01L 29/7801 (2013.01); H01L 29/7851 (2013.01);
Abstract

A fin field effect transistor (FinFET) includes a drain region, a merged drift region, and a plurality of fins. The drain region extends above a surface of a semiconductor substrate and has a first dopant concentration of first conductivity type. The merged drift region extends above the substrate surface and touches the drain region, and has a second lower dopant concentration of the first conductivity type. The plurality of fins extend above the substrate surface and each fin is directly connected to the merged drift region. Each fin is connected to a source region having the first conductivity type at a distal end of that fin from the merged drift region.


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