The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

Aug. 16, 2021
Applicant:

Sandisk Technologies Llc, Addison, TX (US);

Inventors:

Jayavel Pachamuthu, San Jose, CA (US);

Ramkumar Subramanian, Pleasanton, CA (US);

Assignee:

SanDisk Technologies LLC, Addison, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/34 (2006.01); G11C 16/14 (2006.01); G11C 16/04 (2006.01); G11C 16/08 (2006.01); G11C 16/26 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3445 (2013.01); G11C 16/0433 (2013.01); G11C 16/08 (2013.01); G11C 16/14 (2013.01); G11C 16/26 (2013.01);
Abstract

A non-volatile memory system erasing groups of connected memory cells separately performs erase verify for memory cells connected to even word lines to generate even results and erase verify for memory cells connected to odd word lines to generate odd results. The even results and the odd results are used to determine if the erase verify process indicates that the erasing has successful completed. In addition, for each group of connected memory cells, a last even result for the group is compared to a last odd result for the group. Even if the erase verify indicated that the erasing has successfully completed, the system may determine that the erasing failed (i.e. due to a defect) if the number of groups of connected memory cells that have the last even result different than the last odd result is greater than a limit.


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