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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11657335 B1

PDFFull Text
Date of Patent:
May. 23, 2023

Filed:

Jul. 30, 2020

Method for evaluating reliability of a sealing structure in a multi-failure mode based on an adaboost algorithm

Applicant:

Northwestern Polytechnical University, Shaanxi Province, CN;

Inventors:

Feng Zhang, Xi'an, CN;

Xiayu Xu, Yidu, CN;

Peng Wang, Hancheng, CN;

Lei Cheng, Huangshan, CN;

Haotian Xi, Weinan, CN;

Yameng Wang, Zhoukou, CN;

Yang Gao, Anqing, CN;

Assignee:

Other;

Attorney:
Primary Examiner:

Kandasamy Thangavelu

Int. Cl.
CPC ...
G06F 30/23 (2020.01); G06N 20/20 (2019.01); G06F 30/27 (2020.01); G06T 17/20 (2006.01); G06F 18/211 (2023.01); G06F 18/2415 (2023.01); G06N 7/01 (2023.01); G06F 119/02 (2020.01);
U.S. Cl.
CPC ...
G06N 20/20 (2019.01); G06F 18/211 (2023.01); G06F 18/2415 (2023.01); G06F 30/23 (2020.01); G06F 30/27 (2020.01); G06N 7/01 (2023.01); G06T 17/20 (2013.01); G06F 2119/02 (2020.01);
Abstract

A method for evaluating the reliability of a sealing structure in a multi-failure mode based on an Adaboost algorithm. The Adaboost algorithm is adopted to carry out a classification iterative training on the seal ring failure related data of a small sample until a classification error of set classifier meets a precision requirement; then the failure probability of the sealing structure is calculated under the fluctuation condition of related parameters by adopting the important sampling method, and further the reliability of the sealing structure is evaluated in the multi-failure mode. The present invention solves the problems of long time consumption and complex calculation process of reliability evaluation in multi-failure mode of the complex structure.

Find Patent Forward Citations

Zhang, Feng. (2023). Method for evaluating reliability of a sealing structure in a multi-failure mode based on an adaboost algorithm (U.S. Patent No. 11657335). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11657335

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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