The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

Aug. 06, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Steffen Buch, Munich, DE;

Aaron P. Boehm, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); G06F 11/10 (2006.01); H03M 13/15 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G06F 11/076 (2013.01); G06F 11/0772 (2013.01); H03M 13/1575 (2013.01);
Abstract

Methods, systems, and devices for techniques for error detection and correction in a memory system are described. A host device may perform an error detection procedure on data received from the memory device, in addition to one or more error correction procedures that may be performed by the host device, the memory device, or both to correct transmission- or storage-related errors within the system. The error detection procedure may be configured to detect up to a quantity of errors within the data, where the quantity of errors may be greater than a quantity of errors reliably corrected by the one or more error correction procedures. For example, the error detection procedure may be configured to detect a sufficient quantity of errors so as to protect against possible aliasing errors associated with the one or more error correction procedures.


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