The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Jun. 01, 2021
Applicant:

Synopsys, Inc., Mountain View, CA (US);

Inventors:

Vaibhav Jain, Cupertino, CA (US);

Solaiman Rahim, San Francisco, CA (US);

Myunghoon Yoon, Sunnyvale, CA (US);

Qing Su, Mountain View, CA (US);

Assignee:

Synopsys, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/3312 (2020.01); G06F 119/06 (2020.01); G06F 119/12 (2020.01);
U.S. Cl.
CPC ...
G06F 30/3312 (2020.01); G06F 2119/06 (2020.01); G06F 2119/12 (2020.01);
Abstract

Glitch source identification and ranking is provided by: identifying a plurality of glitch sources in a circuit layout; back referencing the plurality of glitch sources to corresponding lines in a Resistor Transistor Logic (RTL) file defining the plurality of glitch sources; identifying, in the circuit layout, a plurality of glitch terminuses associated with the plurality of glitch sources; determining a plurality of glitch power consumption values associated with the plurality of glitch sources based on fanouts in the circuit layout extending from the plurality of glitch sources to the plurality of glitch terminuses; ranking, by a processor, the plurality of glitch sources based on corresponding glitch power consumption values of the plurality of glitch power consumption values corresponding to individual glitch sources of the plurality of glitch sources; and reporting the corresponding lines in the RTL file associated with the ranked plurality of glitch sources.


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