The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2023
Filed:
Jan. 15, 2020
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Kevin R. Brandt, Boise, ID (US);
Todd Marquart, Boise, ID (US);
Assignee:
MICRON TECHNOLOGY, INC., Boise, ID (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/00 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0653 (2013.01); G06F 3/0619 (2013.01); G06F 3/0683 (2013.01);
Abstract
A first delay value is obtained by a first memory subsystem of a plurality of memory subsystems. The first memory subsystem performs a first scan operation after a first time from a first event for the first memory subsystem. The first time is based on the first delay value. A second memory subsystem of the plurality of memory subsystems performs a second scan operation based upon a second delay value that is different than the first delay value.