The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Nov. 30, 2021
Applicant:

Tektronix, Inc., Beaverton, OR (US);

Inventors:

Tyler B. Niles, Beaverton, OR (US);

Daniel G. Knierim, Beaverton, OR (US);

Michael J. Wadzita, Vancouver, WA (US);

Joshua J. O'Brien, Aloha, OR (US);

David Everett Burgess, Beaverton, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/02 (2006.01); G01R 13/02 (2006.01);
U.S. Cl.
CPC ...
G01R 1/025 (2013.01); G01R 13/0218 (2013.01);
Abstract

A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.


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