The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2023
Filed:
Dec. 18, 2020
Applicant:
Carl Zeiss X-ray Microscopy, Inc., Dublin, CA (US);
Inventors:
Matthew Andrew, Dublin, CA (US);
Lars Omlor, Dublin, CA (US);
Hrishikesh Bale, Dublin, CA (US);
Christoph Graf vom Hagen, Dublin, CA (US);
Assignee:
Carl Zeiss X-ray Microscopy, Inc., Dublin, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/13 (2017.01); G06T 7/155 (2017.01); G06V 20/70 (2022.01); G06V 10/764 (2022.01); G01N 23/20 (2018.01); G01N 23/2206 (2018.01); G01N 23/223 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/008 (2013.01); G01N 23/20 (2013.01); G01N 23/223 (2013.01); G01N 23/2206 (2013.01); G06T 7/13 (2017.01); G06T 7/155 (2017.01); G06V 10/764 (2022.01); G06V 20/70 (2022.01); G01N 2223/045 (2013.01); G01N 2223/056 (2013.01); G01N 2223/076 (2013.01); G01N 2223/419 (2013.01); G06T 2207/10121 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/20036 (2013.01); G06T 2207/20212 (2013.01);
Abstract
An x-ray microscopy method that obtains a classification of different particles by distinguishing between different material phases through a combination of image processing involving morphological edge enhancement and possibly resolved absorption contrast differences between the phases along with optional wavelet filtering.