The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2023

Filed:

Nov. 30, 2020
Applicant:

Orbotech Ltd., Yavne, IL;

Inventors:

Gonen Raveh, Moshav Timorim, IL;

Elad Goshen, Beer Sheva, IL;

Assignee:

Orbotech Ltd., Yavne, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2022.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6262 (2013.01); G06K 9/6256 (2013.01); G06K 9/6267 (2013.01); G06N 3/08 (2013.01);
Abstract

An Artificial Intelligence system, an apparatus and, a computer program product and a method for automatic improvement of artificial intelligence classification models. A model-performance measurement of the classification model is iteratively improved by at least a predetermined target goal in each iteration. The iterative improvement comprises generating a hypotheses graph for improving the classification model, based on a list of hypotheses and scores thereof. Each hypothesis relates to a strategy for potentially improving the classification model, and is associated with a score indicating a likelihood that an application thereof improves the model-performance measurement. Each node of the hypotheses graph comprises a hypothesis of the list of hypotheses. The iterative improvement further comprises selecting a selected hypothesis from the hypotheses graph based on a traversal thereof; and executing the selected hypothesis thereby updating the classification model and improving the model-performance measurement by at least the predetermined target goal.


Find Patent Forward Citations

Raveh, Gonen. (2023). Accuracy of classification models (U.S. Patent No. 11640559). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11640559

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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