The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2023

Filed:

Sep. 24, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Violante Moschiano, Avezzano, IT;

Walter Di Francesco, Avezzano, IT;

Kishore Kumar Muchherla, Fremont, CA (US);

Vamsi Pavan Rayaprolu, San Jose, CA (US);

Jeffrey Scott McNeil, Jr., Nampa, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/12 (2006.01); G11C 29/02 (2006.01); G11C 29/20 (2006.01); G11C 29/14 (2006.01);
U.S. Cl.
CPC ...
G11C 29/12005 (2013.01); G11C 29/021 (2013.01); G11C 29/14 (2013.01); G11C 29/20 (2013.01);
Abstract

A memory device to calibrate voltages used to read a group of memory cells. For example, the memory device measures first signal and noise characteristics of a group of memory cells by reading the group of memory cells at first test voltages that are separated from each other by a first voltage interval. An estimate of a read level of the group of memory cells is determined based on the first signal and noise characteristics. The memory device then measures second signal and noise characteristics of the group of memory cells by reading the group of memory cells at second test voltages that are separated from each other by a second voltage interval that is smaller than the first voltage interval. An optimized read voltage for the read level is computed from the second signal and noise characteristics.


Find Patent Forward Citations

Moschiano, Violante. (2023). Global-local read calibration (U.S. Patent No. 11636908). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11636908

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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