The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2023
Filed:
Mar. 29, 2019
Satake Corporation, Tokyo, JP;
Hisashi Sakamoto, Tokyo, JP;
Koshiro Kajiyama, Tokyo, JP;
SATAKE CORPORATION, Tokyo, JP;
Abstract
Provided is a grain gloss measurement apparatus capable of accurately measuring gloss of grain. A grain gloss measurement apparatus includes a light source to emit light to a measurement region for grain in an oblique direction, a light receiver to receive the light reflected from the measurement region, and a gloss value calculation device to calculate a gloss value of the grain based on the reflected light received by the light receiver. The light source includes a first light source to emit light to the measurement region from one side and a second light source to emit light from another side that is opposite to the first light source across the measurement region. The light emitted from the first light source and the light emitted from the second light source have different wavelengths. The light receiver is disposed on the same side as the second light source, and the gloss value calculation device includes an image processing unit to identify a grain zone in the measurement region based on the light of the second light source that is reflected off the grain and received by the light receiver.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile