The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2023

Filed:

Sep. 10, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Anirban Ray, Santa Clara, CA (US);

Samir Mittal, Palo Alto, CA (US);

Gurpreet Anand, Pleasanton, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 16/901 (2019.01); G06N 7/00 (2023.01); G06F 12/0862 (2016.01); G06F 12/02 (2006.01);
U.S. Cl.
CPC ...
G06F 3/064 (2013.01); G06F 3/0607 (2013.01); G06F 3/0679 (2013.01); G06F 12/0862 (2013.01); G06F 16/9024 (2019.01); G06N 7/005 (2013.01); G06F 12/0246 (2013.01); G06F 2212/6024 (2013.01);
Abstract

A graph can be generated based on an access pattern associated with blocks of a memory device that have been accessed by a host system, wherein the graph comprises nodes representing at least a subset of the blocks that have been accessed by the host system and edges that are based on the access pattern, wherein each edge is associated with a respective probability value between a respective pair of nodes. A number of edges having respective probability values that satisfy a probability value threshold criterion can be determined. It can be determined whether the number of edges satisfies a decayed edge value condition. In response to determining that the number of edges does not satisfy the decayed edge value condition, the graph can be removed.


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