The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2023

Filed:

Jan. 27, 2021
Applicant:

Anritsu Corporation, Atsugi, JP;

Inventors:

Tomohiko Maruo, Atsugi, JP;

Hiroyuki Baba, Atsugi, JP;

Masafumi Setsu, Atsugi, JP;

Assignee:

ANRITSU CORPORATION, Atsugi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); G01R 29/08 (2006.01); H04B 17/00 (2015.01); H01Q 3/16 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0871 (2013.01); G01R 29/0821 (2013.01); H01Q 3/16 (2013.01); H04B 17/0085 (2013.01);
Abstract

A test devicethat measures the transmission properties or reception properties of the test objecthaving the test antenna, and includes an anechoic box, a plurality of test antennasthat transmit or receive radio signals to or from the antenna, under tests, a posture changeable mechanismthat changes the posture of the test object arranged in the quiet zone QZ, a measurement devicethat measures the transmission properties or reception properties of the test object with respect to the test object whose posture is changed by the posture changeable mechanism using the test antenna, and the reflectorthat radio signal is reflected. The plurality of test antennas include a reflection type test antennaand the plurality of direct-type test antennas


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