The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2023

Filed:

Aug. 16, 2021
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Xusheng Wu, Hsinchu, TW;

Youbo Lin, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01); H01L 21/02 (2006.01); H01L 21/311 (2006.01); H01L 29/66 (2006.01); H01L 29/40 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7843 (2013.01); H01L 21/0217 (2013.01); H01L 21/02164 (2013.01); H01L 21/02211 (2013.01); H01L 21/02236 (2013.01); H01L 21/02271 (2013.01); H01L 21/31116 (2013.01); H01L 29/401 (2013.01); H01L 29/6656 (2013.01); H01L 29/66545 (2013.01); H01L 29/66795 (2013.01); H01L 29/7851 (2013.01); H01L 21/02255 (2013.01);
Abstract

A semiconductor structure includes a gate stack on a semiconductor substrate and an etch stop layer disposed on the gate stack and the semiconductor substrate. The etch stop layer includes a first portion disposed on sidewalls of the gate stack and a second portion disposed on a top surface of the semiconductor substrate within a source/drain region. The semiconductor structure further includes a dielectric stress layer disposed on the second portion of the etch stop layer and being free from the first portion of the etch stop layer other than at a corner area formed by the first portion intersecting the second portion. The dielectric stress layer is different from the etch stop layer in composition and is configured to apply a compressive stress to a channel region underlying the gate stack.


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