The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2023

Filed:

Jan. 24, 2019
Applicant:

Screen Holdings Co., Ltd., Kyoto, JP;

Inventors:

Takayuki Aoyama, Kyoto, JP;

Akitsugu Ueda, Kyoto, JP;

Mao Omori, Kyoto, JP;

Kazunori Amago, Shiga, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); H01L 21/677 (2006.01); C23C 16/48 (2006.01); C23C 16/44 (2006.01); C23C 16/52 (2006.01); H01L 21/687 (2006.01); H05B 3/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67115 (2013.01); C23C 16/4412 (2013.01); C23C 16/481 (2013.01); C23C 16/482 (2013.01); C23C 16/52 (2013.01); H01L 21/67248 (2013.01); H01L 21/67253 (2013.01); H01L 21/67748 (2013.01); H01L 21/6875 (2013.01); H01L 21/68707 (2013.01); H05B 3/0047 (2013.01);
Abstract

When pressure in a chamber is brought to atmospheric pressure and the chamber is filled with an inert gas atmosphere, the atmosphere in the chamber is sucked into an oxygen concentration analyzer through a sampling line such that oxygen concentration in the chamber is measured by the oxygen concentration analyzer. When the pressure in the chamber is reduced to less than atmospheric pressure, nitrogen gas is supplied to the oxygen concentration analyzer through an inert gas supply line simultaneously with suspending the measurement of oxygen concentration in the chamber. Even when the measurement of oxygen concentration in the chamber is suspended, reverse flow to the oxygen concentration analyzer from a gas exhaust pipe can be prevented, and the oxygen concentration analyzer can be prevented from being exposed to exhaust from the chamber. The configuration results in maintaining measurement accuracy of the oxygen concentration analyzer in a low oxygen concentration range.


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