The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2023

Filed:

Aug. 09, 2018
Applicant:

Asmpt Singapore Pte. Ltd., Singapore, SG;

Inventors:

Kwok Pun Law, Hong Kong, HK;

Hong Yeung Li, Hong Kong, HK;

Cho Wai Leung, Hong Kong, HK;

Assignee:

ASMPT SINGAPORE PTE, LTD., Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B30B 15/14 (2006.01); B30B 15/18 (2006.01); H01L 21/67 (2006.01); B30B 15/28 (2006.01); B30B 15/00 (2006.01);
U.S. Cl.
CPC ...
B30B 15/148 (2013.01); B30B 15/0094 (2013.01); B30B 15/28 (2013.01); H01L 21/67092 (2013.01); H01L 21/67253 (2013.01);
Abstract

A semiconductor device is located between a first die-set part and a second die-set part of a press, and the first and second die-set parts are moved relative to each other for punching and shaping the semiconductor device therebetween. At least one parameter is monitored with at least one sensor attached to the first die-set part and/or the second die-set part at different positions of the first die-set part when it is moving relative to the second die-set part. Variations of the at least one parameter at different relative positions of the first and second die-set parts are compared, and a failure is determined to have occurred when the present variation of the parameter is different from its expected variation during normal operation of the press when there is no failure.


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