The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2023
Filed:
Jul. 21, 2020
Applicant:
Jeol Ltd., Tokyo, JP;
Inventors:
Kazunori Tsukamoto, Tokyo, JP;
Shigeru Honda, Tokyo, JP;
Assignee:
JEOL Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/2209 (2018.01); G01N 23/2208 (2018.01); G01N 23/2252 (2018.01);
U.S. Cl.
CPC ...
G01N 23/2209 (2018.02); G01N 23/2208 (2013.01); G01N 23/2252 (2013.01); G01N 2223/072 (2013.01); G01N 2223/079 (2013.01); G01N 2223/507 (2013.01);
Abstract
An analyzer includes a wavelength-dispersive X-ray spectrometer and a control unit that controls the wavelength-dispersive X-ray spectrometer, the control unit performing: processing of acquiring an analysis result of preparatory analysis performed on a specimen to be analyzed; processing of setting spectroscopic conditions for WDS analysis using the wavelength-dispersive X-ray spectrometer based on the analysis result of the preparatory analysis; and processing of performing the WDS analysis on the specimen to be analyzed under the set spectroscopic conditions.