The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2023

Filed:

Mar. 01, 2021
Applicant:

Nxp B.v., Eindhoven, NL;

Inventors:

Mark Douglas Hall, Austin, TX (US);

Tushar Praful Merchant, Austin, TX (US);

Anirban Roy, Austin, TX (US);

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 29/788 (2006.01); H01L 29/786 (2006.01); H01L 29/423 (2006.01); H01L 29/40 (2006.01); H01L 27/11521 (2017.01);
U.S. Cl.
CPC ...
H01L 29/66825 (2013.01); H01L 29/401 (2013.01); H01L 29/42324 (2013.01); H01L 29/42392 (2013.01); H01L 29/66545 (2013.01); H01L 29/66742 (2013.01); H01L 29/7881 (2013.01); H01L 29/78696 (2013.01); H01L 27/11521 (2013.01);
Abstract

A semiconductor device and fabrication method are described for integrating a nanosheet transistor with a capacitor or nonvolatile memory cell in a single nanosheet process flow by forming a nanosheet transistor stack (-) of alternating Si and SiGe layers which are selectively processed to form epitaxial source/drain regions (A,B) and to form gate electrodes (A-D) which replace the silicon germanium layers in the nanosheet transistor stack, and then selectively forming one or more insulated conductive electrode layers (e.g.,) adjacent to the nanosheet transistor to define a capacitor or nonvolatile memory cell that is integrated with the nanosheet transistor.


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