The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2023

Filed:

Mar. 16, 2020
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Manabu Nakagawasai, Tokyo, JP;

Naoyuki Suzuki, Tokyo, JP;

Shinji Orimoto, Yamanashi, JP;

Hiroyuki Yokohara, Yamanashi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); G01K 13/00 (2021.01); H01L 21/687 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67248 (2013.01); G01K 13/00 (2013.01); H01L 21/67098 (2013.01); H01L 21/67184 (2013.01); H01L 21/68764 (2013.01);
Abstract

A temperature measuring device that measures a temperature of a rotatable stage that holds a substrate, includes: a contact portion provided at a position that does not hinder placing of the substrate on the stage, and a temperature detector having a temperature sensor, and provided at a position separated from the temperature detection contact portion except when measuring a temperature. When measuring the temperature of the stage, the temperature detection contact portion and the temperature detector are relatively moved and brought into contact with each other in a state where the stage is not rotating to detect the temperature of the stage.


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