The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2023

Filed:

Jun. 30, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Satoshi Morishita, Yokohama, JP;

Yoshifumi Mochida, Sagamihara, JP;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01); G11C 11/408 (2006.01); G11C 29/12 (2006.01); G11C 11/4091 (2006.01);
U.S. Cl.
CPC ...
G11C 11/4087 (2013.01); G11C 11/4085 (2013.01); G11C 11/4091 (2013.01); G11C 29/12 (2013.01); G11C 2029/1202 (2013.01);
Abstract

Disclosed herein is an apparatus that includes a plurality of memory sections each including a plurality of word lines, a predecoder circuit configured to generate predecoded section address signals to select one of the plurality of memory sections and predecoded word line address signals to select one of the word lines included in a selected one of the plurality of memory sections based on a row address, and a section address control circuit configured to retain the predecoded section address signals regardless of an update of the row address in a test operation mode.


Find Patent Forward Citations

Morishita, Satoshi. (2023). Semiconductor device having a test circuit (U.S. Patent No. 11605419). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11605419

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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