The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2023
Filed:
Dec. 15, 2020
Applicant:
Teradyne, Inc., North Reading, MA (US);
Inventors:
Roger A. Sinsheimer, North Reading, MA (US);
Daniel L. Engel, North Reading, MA (US);
Leal J. Daniels, North Reading, MA (US);
Assignee:
TERADYNE, INC., North Reading, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 31/28 (2006.01); G01R 31/317 (2006.01); G01R 1/06 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2834 (2013.01); G01R 1/06 (2013.01);
Abstract
An example test system includes a test head, and a device interface board (DIB) configured to connect to the test head. The DIB is for holding devices under test (DUTs). The DIB includes electrical conductors for transmitting electrical signals between the DUTs and the test head. Servers are programmed to function as test instruments. The servers are external to, and remote from, the test head and are configured to communicate signals over fiber optic cables with the test head. The signals include serial signals.