The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Feb. 01, 2022
Applicants:

Adobe Inc., San Jose, CA (US);

Institut Mines Telecom, Palaiseau, FR;

Inventors:

Thibaud Lambert, Paris, FR;

Tamy Boubekeur, Paris, FR;

Anthony Salvi, Paris, FR;

Assignee:

Adobe Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/20 (2006.01); G06T 3/40 (2006.01); G06T 5/00 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 17/20 (2013.01); G06T 3/4007 (2013.01); G06T 5/003 (2013.01); G06T 11/001 (2013.01);
Abstract

The disclosure describes one or more embodiments of systems, methods, and non-transitory computer-readable media that utilize a sharpness map that includes information on how to filter a displacement map on a per-texel basis to preserve sharp features while sampling a displacement map. For instance, the disclosed systems utilize a sharpness map that encodes combinable patterns to represent discontinuities of features within a displacement map. In some embodiments, the disclosed systems generate a sharpness map having texels encoded with discontinuity configurations that are referenced to control filtering (e.g., via interpolation) of a displacement map such that sharp features within the displacement map are not lost (due to smoothing during interpolation). For example, the disclosed systems filter feature values of a displacement map using discontinuities identified within a sharpness map to interpolate when the feature value(s) and a sampling point are identified as being on the same side of a discontinuity.


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