The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Jan. 14, 2022
Applicant:

Changxin Memory Technologies, Inc., Hefei, CN;

Inventor:

Xiaofeng Xu, Hefei, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 21/79 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 21/79 (2013.01); G06F 2221/034 (2013.01);
Abstract

The present disclosure provides a memory test method. The method includes: determining a refresh cycle T, a designed attack resistance frequency F, and a single row read time t of a target repository; determining an attack row quantity N based on the refresh cycle T, the designed attack resistance frequency F, and the single row read time t; determining a group of target attack rows in the target repository based on a value of the attack row quantity N, where the group of target attack rows include N target attack rows, and at least two of the N target attack rows are spaced apart by one row; detecting, after reading the N target attack rows for X consecutive times, whether data exception occurs in all adjacent rows of the target attack rows, to complete one attack test.


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