The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Sep. 25, 2020
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Katalin Klara Bartfai-Walcott, El Dorado Hills, CA (US);

Arkadiusz Berent, Tuchom, PL;

Vasuki Chilukuri, Hillsboro, OR (US);

Mark Baldwin, Hillsboro, OR (US);

Vasudevan Srinivasan, Portland, OR (US);

Bartosz Gotowalski, Gdansk, PL;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/445 (2018.01); G06F 21/10 (2013.01); H04L 9/32 (2006.01); G06F 11/30 (2006.01); G06Q 10/08 (2012.01); G06Q 30/04 (2012.01); G06Q 10/087 (2023.01);
U.S. Cl.
CPC ...
G06F 9/44505 (2013.01); G06F 11/3058 (2013.01); G06F 21/105 (2013.01); H04L 9/3247 (2013.01); H04L 9/3268 (2013.01); H04L 9/3278 (2013.01); G06F 2221/0768 (2013.01); G06Q 10/087 (2013.01); G06Q 30/04 (2013.01);
Abstract

Methods, apparatus, systems and articles of manufacture (e.g., physical storage media) to provide device enhancements for software defined silicon implementations are disclosed. Example apparatus disclosed herein include a request interface to receive a request for a timestamp. Disclosed example apparatus also include a property checker to determine a first value of an electrical property of a feature embedded in a silicon product, the feature having electrical properties that change over time. Disclosed example apparatus further include a relative time determiner to calculate a relative time between the request and a previous event based on the first value of the electrical property and a second value of the electrical property, the second value of the electrical property associated with the previous event.


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